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Fault prediction model with limited fault data to improve test process

dc.contributor.authorCatal, Cagatay
dc.contributor.authorDiri, Banu
dc.date.accessioned2026-06-27T13:08:29Z
dc.date.issued2008
dc.description.abstractSoftware fault prediction models are used to identify the fault-prone software modules and produce reliable software. Performance of a software fault prediction model is correlated with available software metrics and fault data. In some occasions, there may be few software modules having fault data and therefore, prediction models using only labeled data can not provide accurate results. Semi-supervised learning approaches which benefit from unlabeled and labeled data may be applied in this case. In this paper, we propose an artificial immune system based semi-supervised learning approach. Proposed approach uses a recent semi-supervised algorithm called YATSI (Yet Another Two Stage Idea) and in the first stage of YATSI, AIRS (Artificial Immune Recognition Systems) is applied. In addition, AIRS, RF (Random Forests) classifier, AIRS based YATSI, and RF based YATSI are benchmarked. Experimental results showed that while YATSI algorithm improved the performance of AIRS, it diminished the performance of RF for unbalanced datasets. Furthermore, performance of AIRS based YATSI is comparable with RF which is the best machine learning classifier according to some researches.en
dc.description.sponsorshipThe Scientific and Technological Research Council of TURKEY (TUBITAK) [107E213]
dc.identifier.eissn1611-3349
dc.identifier.endpage+
dc.identifier.isbn978-3-540-69564-6
dc.identifier.issn0302-9743
dc.identifier.startpage244
dc.identifier.urihttps://hdl.handle.net/20.500.14981/50304
dc.identifier.volume5089
dc.identifier.wos000257182700018
dc.language.isoeng
dc.publisherSPRINGER-VERLAG BERLIN
dc.relation.conference9th International Conference on Product-Focused Software Process Improvement
dc.relation.ispartofPRODUCT-FOCUSED SOFTWARE PROCESS IMPROVEMENT, PROCEEDINGS
dc.subjectsemi-supervised learning
dc.subjectsoftware fault prediction
dc.subjectYATSI
dc.subjectartificial immune systems
dc.subjectAIRS
dc.subjectCLASSIFICATION
dc.subjectComputer Science
dc.titleFault prediction model with limited fault data to improve test process
dc.typeProceedings Paper
dspace.entity.typePublication
local.import.sourceWOS

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