Publication:
Critical parameters of the sparse representation-based classifier

Loading...
Thumbnail Image

Date

Institution Authors

Item type:Person,

Advisor

item.page.editor

Editor

Department

Journal Title

Journal ISSN

Volume Title

Publisher

INST ENGINEERING TECHNOLOGY-IET

DOI

10.1049/iet-cvi.2012.0127
View PlumX Details

Research Projects

Organizational Units

Journal Issue

Abstract

In recent years, the growing attention in the study of the compressive sensing (CS) theory suggested a novel classification algorithm called sparse representation-based classifier (SRC), which obtained promising results by casting classification as a sparse representation problem. Whereas SRC has been applied to different fields of applications and several variations of it have been proposed, less attention has been given to its critical parameters, that is, measurements correlated to its performance. This work underlines the differences between CS and SRC, it gives a mathematical definition of five measurements possible correlated to the performance of SRC and identifies three of them as critical parameters. The knowledge of the critical parameters is necessary to fuse multiple scores of SRC classifiers allowing for classification. The authors addressed the problem of two-dimensional face classification: using the Extended Yale B dataset to monitor the critical parameters and the Extended Cohn-Kanade database to test the robustness of SRC with emotional faces. Finally, the authors increased the initial performance of the holistic SRC with a block-based SRC, which uses one critical parameter for automatic selection of the most successful blocks.

Description

Journal or Series

IET COMPUTER VISION

ISSN

1751-9632

ISBN

Citation

Collections

Endorsement

Review

Supplemented By

Referenced By

Related Patent

Related Goal

0

Views

0

Downloads