Yayın: The investigation of electrodeposited Cu2O/ITO layers by chronocoulometry process: effect of electrical potential
| dc.contributor.author | Mohra, D. | |
| dc.contributor.author | Benhaliliba, M. | |
| dc.contributor.author | Serin, M. | |
| dc.contributor.author | Khelladi, M. R. | |
| dc.contributor.author | Lahmar, H. | |
| dc.contributor.author | Azizi, A. | |
| dc.date.accessioned | 2026-06-27T13:59:15Z | |
| dc.date.issued | 2016 | |
| dc.description.abstract | The thin films of Cu2O are deposited by electrodeposition technique onto indium tin oxide (ITO)-coated glass substrate at different potentials. The precursor is an aqueous solution which contains respectively 0.05 M of CuSO4 and citric acid at kept temperature of 60 degrees C and the applied potential varies within the {-0: 4 V, -0: 7 V} SCE range. Based on the chronocoulometry (CC) process, the electrochemical, structural and optical parameters are determined. We measured the current as function of potential within the {-0.4 V, -0.7 V} range and the higher current is found to be within the {-0.7 V, -0.3 V} band. The grain sizes are of 12.12 nm and 35.47 nm according to (110) and (221) orientations respectively. The high textural coefficient of 0.943 is recorded for the potential -0.7 V. The transmittance of 72.25 %, within the visible band, is obtained for the as-grown layer at -0.4 V and the band gap is found to be 2.2 eV for the electrodeposition potential of -0.7 V. | en |
| dc.description.sponsorship | PNR [8/U311/R77, U311/R81] | |
| dc.description.sponsorship | Agencethematique de rechercheen science ettechnologie (ATRST) | |
| dc.description.sponsorship | National Administration of Scientific Research | |
| dc.description.sponsorship | CNEPRU of Oran University of Sciences and Technology [B00L02UN310220130011] | |
| dc.description.sponsorship | Scientific Research Projects Coordination Yildiz Technical University [2012-01-01-KAP05, 2012-01-01-KAP06] | |
| dc.description.uri | https://doi.org/10.1088/1674-4926/37/10/103001 | |
| dc.identifier.doi | 10.1088/1674-4926/37/10/103001 | |
| dc.identifier.issn | 1674-4926 | |
| dc.identifier.issue | 10 | |
| dc.identifier.uri | https://hdl.handle.net/20.500.14981/56281 | |
| dc.identifier.volume | 37 | |
| dc.identifier.wos | 000390142200005 | |
| dc.language.iso | eng | |
| dc.publisher | IOP PUBLISHING LTD | |
| dc.relation.ispartof | JOURNAL OF SEMICONDUCTORS | |
| dc.subject | Cu2O films | |
| dc.subject | chronocoulometry | |
| dc.subject | electrodeposition | |
| dc.subject | ITO substrate | |
| dc.subject | voltammogram | |
| dc.subject | cathodic potential | |
| dc.subject | THIN-FILMS | |
| dc.subject | OXIDE | |
| dc.subject | Physics | |
| dc.title | The investigation of electrodeposited Cu2O/ITO layers by chronocoulometry process: effect of electrical potential | |
| dc.type | Article | |
| dspace.entity.type | Publication | |
| local.import.source | WOS |