Yayın:
The investigation of electrodeposited Cu2O/ITO layers by chronocoulometry process: effect of electrical potential

dc.contributor.authorMohra, D.
dc.contributor.authorBenhaliliba, M.
dc.contributor.authorSerin, M.
dc.contributor.authorKhelladi, M. R.
dc.contributor.authorLahmar, H.
dc.contributor.authorAzizi, A.
dc.date.accessioned2026-06-27T13:59:15Z
dc.date.issued2016
dc.description.abstractThe thin films of Cu2O are deposited by electrodeposition technique onto indium tin oxide (ITO)-coated glass substrate at different potentials. The precursor is an aqueous solution which contains respectively 0.05 M of CuSO4 and citric acid at kept temperature of 60 degrees C and the applied potential varies within the {-0: 4 V, -0: 7 V} SCE range. Based on the chronocoulometry (CC) process, the electrochemical, structural and optical parameters are determined. We measured the current as function of potential within the {-0.4 V, -0.7 V} range and the higher current is found to be within the {-0.7 V, -0.3 V} band. The grain sizes are of 12.12 nm and 35.47 nm according to (110) and (221) orientations respectively. The high textural coefficient of 0.943 is recorded for the potential -0.7 V. The transmittance of 72.25 %, within the visible band, is obtained for the as-grown layer at -0.4 V and the band gap is found to be 2.2 eV for the electrodeposition potential of -0.7 V.en
dc.description.sponsorshipPNR [8/U311/R77, U311/R81]
dc.description.sponsorshipAgencethematique de rechercheen science ettechnologie (ATRST)
dc.description.sponsorshipNational Administration of Scientific Research
dc.description.sponsorshipCNEPRU of Oran University of Sciences and Technology [B00L02UN310220130011]
dc.description.sponsorshipScientific Research Projects Coordination Yildiz Technical University [2012-01-01-KAP05, 2012-01-01-KAP06]
dc.description.urihttps://doi.org/10.1088/1674-4926/37/10/103001
dc.identifier.doi10.1088/1674-4926/37/10/103001
dc.identifier.issn1674-4926
dc.identifier.issue10
dc.identifier.urihttps://hdl.handle.net/20.500.14981/56281
dc.identifier.volume37
dc.identifier.wos000390142200005
dc.language.isoeng
dc.publisherIOP PUBLISHING LTD
dc.relation.ispartofJOURNAL OF SEMICONDUCTORS
dc.subjectCu2O films
dc.subjectchronocoulometry
dc.subjectelectrodeposition
dc.subjectITO substrate
dc.subjectvoltammogram
dc.subjectcathodic potential
dc.subjectTHIN-FILMS
dc.subjectOXIDE
dc.subjectPhysics
dc.titleThe investigation of electrodeposited Cu2O/ITO layers by chronocoulometry process: effect of electrical potential
dc.typeArticle
dspace.entity.typePublication
local.import.sourceWOS

Dosyalar

Koleksiyonlar