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Optical and structural properties of Ta2O5-CeO2 thin films

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dc.contributor.authorSaygin-Hinczewski, D.
dc.contributor.authorKoc, K.
dc.contributor.authorSorar, I.
dc.contributor.authorHinczewski, M.
dc.contributor.authorTepehan, F. Z.
dc.contributor.authorTepehan, G. G.
dc.contributor.institutionauthorKOÇ, Kenan
dc.date.accessioned2026-06-27T13:05:47Z
dc.date.issued2007
dc.description.abstractIn this study, the sol-gel spin-coating method has been used to make Ta2O5-CeO2 thin films. These films have been prepared in various composition ratios to observe changes in their optical and structural properties. Reflectance and transmittance spectra were collected in the spectral range of 300-1000 nm and were accurately fit using the Tauc-Lorentz model. Film thicknesses, refractive indices, absorption coefficients, and optical band gaps were extracted from the theoretical fit. The highest refractive index value was found at 5% CeO2 doping. The structure of the films was characterized by X-ray diffractometry and Fourier transform infrared spectrometry, while the surface morphology was examined through atomic force microscopy. (C) 2007 Elsevier B.V. All rights reserved.en
dc.description.urihttps://doi.org/10.1016/j.solmat.2007.05.029
dc.identifier.doi10.1016/j.solmat.2007.05.029
dc.identifier.eissn1879-3398
dc.identifier.endpage1732
dc.identifier.issn0927-0248
dc.identifier.issue18
dc.identifier.startpage1726
dc.identifier.urihttps://hdl.handle.net/20.500.14981/49663
dc.identifier.volume91
dc.identifier.wos000249898100013
dc.language.isoeng
dc.publisherELSEVIER
dc.relation.ispartofSOLAR ENERGY MATERIALS AND SOLAR CELLS
dc.subjectsol-gel
dc.subjectspin coating
dc.subjectTa2O5-CeO2 thin films
dc.subjectTauc-Lorentz model
dc.subjectDIELECTRIC-PROPERTIES
dc.subjectSUBSTITUTION
dc.subjectEnergy & Fuels
dc.subjectMaterials Science
dc.subjectPhysics
dc.titleOptical and structural properties of Ta2O5-CeO2 thin films
dc.typeArticle
dspace.entity.typePublication
local.import.sourceWOS

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