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The Degradation Analysis of XLPE Materials Under Thermal Aging: A Comprehensive Study Through Partial Discharge Measurements and Structural Characterization Techniques

dc.contributor.authorCamalov, Mehti
dc.contributor.authorAkin, Firat
dc.contributor.authorHashimov, Arif
dc.contributor.authorArikan, Oktay
dc.contributor.authorOrucov, Allahverdi
dc.contributor.authorGuliyev, Musafir
dc.date.accessioned2026-06-27T15:07:08Z
dc.date.issued2024
dc.description.abstractThis article focuses on the impact of thermal aging on the insulation material used in cross-linked polyethylene (XLPE) cables. During the experimental process, the samples are subjected to thermal aging at 120 degrees C for 450 h in total. The impact of thermal stress on insulation quality is analyzed through partial discharge (PD) parameters. Accordingly, the average PD charge of peroxide and silane-added samples increased by 72% and 37%, respectively. Also, their partial discharge inception voltages decreased by 9% and 12.5%, respectively. For investigation of the root causes of the increase in partial discharge activity, Fourier transform infrared spectroscopy (FTIR), X-ray diffraction (XRD), and ultraviolet-visible (UV-Vis) spectrophotometers are used. The structural changes caused by thermal aging were characterized through FTIR spectroscopy as the formation of new chemical bonds, chain degradation and increased absorption of hydroxyl and carbonyl groups. Additionally, XRD analysis showed alterations in crystallization degree, while UV-Vis spectral analysis demonstrated higher absorbances and a decrease in band gap energies for peroxide and silane-added XLPE samples, respectively, to 3.8 eV and 3.36 eV after thermal aging.en
dc.description.urihttps://doi.org/10.1007/s42341-024-00533-4
dc.identifier.doi10.1007/s42341-024-00533-4
dc.identifier.eissn2092-7592
dc.identifier.endpage506
dc.identifier.issn1229-7607
dc.identifier.issue4
dc.identifier.startpage494
dc.identifier.urihttps://hdl.handle.net/20.500.14981/68153
dc.identifier.volume25
dc.identifier.wos001201324600001
dc.language.isoeng
dc.publisherSPRINGER
dc.relation.ispartofTRANSACTIONS ON ELECTRICAL AND ELECTRONIC MATERIALS
dc.subjectThermal aging
dc.subjectInsulation degradation
dc.subjectXLPE
dc.subjectPartial discharge
dc.subjectCharacterization techniques
dc.subjectINSULATION SYSTEMS
dc.subjectSPACE-CHARGE
dc.subjectCABLE
dc.subjectNANOCOMPOSITES
dc.subjectBEHAVIOR
dc.subjectRESIN
dc.subjectMaterials Science
dc.titleThe Degradation Analysis of XLPE Materials Under Thermal Aging: A Comprehensive Study Through Partial Discharge Measurements and Structural Characterization Techniques
dc.typeArticle
dspace.entity.typePublication
local.import.sourceWOS

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