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Structural, electrical transport and NO2 sensing properties of Y-doped ZnO thin films

dc.contributor.authorKilinc, Necmettin
dc.contributor.authorOzturk, Sadullah
dc.contributor.authorArda, Lutfi
dc.contributor.authorAltindal, Ahmet
dc.contributor.authorOzturk, Zafer Ziya
dc.date.accessioned2026-06-27T13:18:38Z
dc.date.issued2012
dc.description.abstractYttrium (Y) doped ZnO thin films with concentrations of 1 at.%, 5 at.% and 10 at.% Y concentrations were deposited on glass substrates by using sol-gel dip coating method. The electrical properties of the films were measured dependence on temperature to identify the dominant conduction mechanism. It was found that thermally activated band conduction was the dominant conduction mechanism at high temperatures whereas, in the low temperature region, the dependence of the dc conductivity on temperature followed Mott's variable range hopping (VRH) model. The temperature dependence of both the ac conductivity and the frequency exponent are reasonably well interpreted by the correlated barrier hopping (CBH) model. The imaginary part of the impedance at different temperatures shows a relaxation peak and its position shifts to higher frequency with increasing temperature. This suggests a temperature-dependent relaxation. As an application, the NO2 sensing properties of the films were investigated at 200 degrees C in the concentration ranges of 100 ppb-1 ppm. The response characteristics of Y-doped ZnO films have shown a high sensitivity to NO2 at this temperature and the highest sensor response were observed for 1 at.% Y-doped ZnO film. (C) 2012 Elsevier B.V. All rights reserved.en
dc.description.sponsorshipTUBITAK [111M261]
dc.description.sponsorshipDPT [2009K120730]
dc.description.urihttps://doi.org/10.1016/j.jallcom.2012.04.104
dc.identifier.doi10.1016/j.jallcom.2012.04.104
dc.identifier.endpage144
dc.identifier.issn0925-8388
dc.identifier.startpage138
dc.identifier.urihttps://hdl.handle.net/20.500.14981/51764
dc.identifier.volume536
dc.identifier.wos000306691900022
dc.language.isoeng
dc.publisherELSEVIER SCIENCE SA
dc.relation.ispartofJOURNAL OF ALLOYS AND COMPOUNDS
dc.subjectYttrium doped ZnO
dc.subjectCBH
dc.subjectVRH
dc.subjectNO2 sensing
dc.subjectConduction mechanism
dc.subjectDip coating
dc.subjectSOL-GEL PREPARATION
dc.subjectZINC-OXIDE FILMS
dc.subjectGAS SENSORS
dc.subjectCONDUCTIVITY
dc.subjectTRANSPARENT
dc.subjectSEMICONDUCTORS
dc.subjectDEPENDENCE
dc.subjectNANOWIRES
dc.subjectINDIUM
dc.subjectAL
dc.subjectChemistry
dc.subjectMaterials Science
dc.subjectMetallurgy & Metallurgical Engineering
dc.titleStructural, electrical transport and NO2 sensing properties of Y-doped ZnO thin films
dc.typeArticle
dspace.entity.typePublication
local.import.sourceWOS

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