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Predicting Patent Quality Based on Machine Learning Approach

dc.contributor.authorErdogan, Zulfiye
dc.contributor.authorAltuntas, Serkan
dc.contributor.authorDereli, Turkay
dc.date.accessioned2026-06-27T14:42:07Z
dc.date.issued2024
dc.description.abstractThe investment budget allocated by companies in R&D activities has increased due to increased competition in the market. Applications for industrial property rights by countries, investors, companies, and universities to protect inventions obtained as an outcome of investments have also increased. The selection of the patent to be invested becomes more difficult with the increasing number of applications. Therefore, predicting patent quality is quite significant for companies to be successful in the future. The level to which a patent meets the expectations of decision makers is referred to as patent quality. Patent indices represent decision makers' expectations. In this study, an approach is proposed to predict patent quality in practice. The proposed approach uses supervised learning algorithms and analytic hierarchy process (AHP) method. The proposed approach is applied to patents related to personal digital assistant technologies. The performances of individual and ensemble machine learning methods have been also analyzed to establish the prediction model. In addition, 75% split ratio and the five-fold cross-validation methods have been used to verify the prediction model. The multilayer perceptron algorithm has 76% accuracy value. The proposed prediction model is essential in directing R&D studies to the right technology areas and transferring the incentives to patent applications with a high quality rate.en
dc.description.urihttps://doi.org/10.1109/tem.2022.3207376
dc.identifier.doi10.1109/tem.2022.3207376
dc.identifier.eissn1558-0040
dc.identifier.endpage3157
dc.identifier.issn0018-9391
dc.identifier.startpage3144
dc.identifier.urihttps://hdl.handle.net/20.500.14981/63702
dc.identifier.volume71
dc.identifier.wos000862350800001
dc.language.isoeng
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
dc.relation.ispartofIEEE TRANSACTIONS ON ENGINEERING MANAGEMENT
dc.subjectPatents
dc.subjectCodes
dc.subjectClustering algorithms
dc.subjectPrediction algorithms
dc.subjectMachine learning algorithms
dc.subjectPredictive models
dc.subjectTechnological innovation
dc.subjectAnalytic hierarchy process (AHP)
dc.subjectmachine learning
dc.subjectmultilayer perceptron
dc.subjectpatent indices
dc.subjectsupervised learning algorithms
dc.subjectMULTICRITERIA DECISION-MAKING
dc.subjectSCIENCE-AND-TECHNOLOGY
dc.subjectFORECASTING TECHNOLOGY
dc.subjectEMERGING TECHNOLOGIES
dc.subjectPROMISING TECHNOLOGY
dc.subjectENERGY TECHNOLOGY
dc.subjectNETWORK ANALYSIS
dc.subjectSELECTION
dc.subjectINDICATORS
dc.subjectALGORITHM
dc.subjectBusiness & Economics
dc.subjectEngineering
dc.titlePredicting Patent Quality Based on Machine Learning Approach
dc.typeArticle
dspace.entity.typePublication
local.import.sourceWOS

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