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TOPOLOGICAL INVERSION

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dc.contributor.authorSENGOR, T
dc.date.accessioned2026-06-27T12:57:02Z
dc.date.issued1994
dc.description.urihttps://doi.org/10.1117/12.186728
dc.identifier.doi10.1117/12.186728
dc.identifier.endpage294
dc.identifier.isbn0-8194-1599-5
dc.identifier.startpage283
dc.identifier.urihttps://hdl.handle.net/20.500.14981/48062
dc.identifier.volume2275
dc.identifier.wosA1994BB54W00031
dc.language.isoeng
dc.publisherSPIE - INT SOC OPTICAL ENGINEERING
dc.relation.conferenceConference on Advanced Microwave and Millimeter-Wave Detectors
dc.relation.ispartofADVANCED MICROWAVE AND MILLIMETER-WAVE DETECTORS
dc.subjectTOPOLOGICAL INVERSION
dc.subjectEXACT TARGET SENSING
dc.subjectIMAGING
dc.subjectTOPOLOGICAL DIFFRACTION
dc.subjectEXACT MODELING
dc.subjectRemote Sensing
dc.subjectOptics
dc.titleTOPOLOGICAL INVERSION
dc.typeProceedings Paper
dspace.entity.typePublication
local.import.sourceWOS

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