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Synthesis and electrical characterization of Graphene Oxide films

dc.contributor.authorYasin, Muhammad
dc.contributor.authorTauqeer, T.
dc.contributor.authorZaidi, Syed M. H.
dc.contributor.authorSan, Sait E.
dc.contributor.authorMahmood, Asad
dc.contributor.authorKose, Muhammet E.
dc.contributor.authorCanimkurbey, Betul
dc.contributor.authorOkutan, Mustafa
dc.date.accessioned2026-06-27T13:43:50Z
dc.date.issued2015
dc.description.abstractIn this work, we have synthesized Graphene Oxide (GO) using modified Hummers method and investigated its electrical properties using parallel plate impedance spectroscopic technique. Graphene Oxide films were prepared using drop casting method on Indium Tin Oxide (ITO) coated glass substrate. Atomic force microscopy was used to characterize the films' microstructure and surface topography. Electrical characterization was carried out using LCR meter in frequency regime (100 Hz to 10 MHz) at different temperatures. AC conductivity sigma(ac) of the films was observed to be varied with angular frequency, omega as omega(S), with S < 1. The electrical properties of GO were found to be both frequency and temperature dependent. Analysis showed that GO film contains direct current (DC) and Correlated Barrier Hopping (CBH) conductivity mechanisms at low and high frequency ranges, respectively. Photon absorption and transmittance capability in the visible range and excellent electrical parameters of solution processed Graphene Oxide suggest its suitability for the realization of low cost flexible organic solar cells and organic Thin Film Transistors, respectively. (C) 2015 Elsevier B.V. All rights reserved.en
dc.description.sponsorshipTurkish Research and Technological Council (TUBITAK)
dc.description.sponsorship2216 program
dc.description.urihttps://doi.org/10.1016/j.tsf.2015.07.042
dc.identifier.doi10.1016/j.tsf.2015.07.042
dc.identifier.endpage123
dc.identifier.issn0040-6090
dc.identifier.startpage118
dc.identifier.urihttps://hdl.handle.net/20.500.14981/54575
dc.identifier.volume590
dc.identifier.wos000361057100020
dc.language.isoeng
dc.publisherELSEVIER SCIENCE SA
dc.relation.ispartofTHIN SOLID FILMS
dc.subjectGraphene Oxide
dc.subjectDielectric Constant
dc.subjectAC conductivity
dc.subjectLCR-meter
dc.subjectDIELECTRIC-RELAXATION
dc.subjectTHIN-FILMS
dc.subjectHUMIDITY
dc.subjectELECTRONICS
dc.subjectGLASSES
dc.subjectLAYER
dc.subjectMaterials Science
dc.subjectPhysics
dc.titleSynthesis and electrical characterization of Graphene Oxide films
dc.typeArticle
dspace.entity.typePublication
local.import.sourceWOS

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