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A Comparative Study on Power MOSFET Reliability and Failure Modes

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dc.contributor.authorBilir, Rahmet Aybuke
dc.contributor.authorAltintas, Nihan
dc.contributor.authorBilir, Aydogan
dc.contributor.authorMese, Erkan
dc.contributor.authorTosunoglu, Zulal
dc.date.accessioned2026-06-27T14:22:09Z
dc.date.issued2019
dc.description.abstractIn this study, based on the characteristic parameters of MOSFET's degradation, reliability of MOSFETs from different companies has been compared. Same type of MOSFETs are investigated. Acceleration test are designed and devices are degraded. According to degradation data, transfer characterization is investigated and failure modes of MOSFETs have been examined. This degradation data of values have been observed %10 variance which is degradation's sign.en
dc.description.urihttps://doi.org/10.1109/infoteh.2019.8717762
dc.identifier.doi10.1109/infoteh.2019.8717762
dc.identifier.isbn978-1-5386-7073-6
dc.identifier.urihttps://hdl.handle.net/20.500.14981/59795
dc.identifier.wos000470898500029
dc.language.isoeng
dc.publisherIEEE
dc.relation.conference18th International Symposium INFOTEH-JAHORINA (INFOTEH)
dc.relation.ispartof2019 18TH INTERNATIONAL SYMPOSIUM INFOTEH-JAHORINA (INFOTEH)
dc.subjectDegradation
dc.subjectReliability
dc.subjectMOSFET
dc.subjecttransfer characterisation
dc.subjectfailure mode
dc.subjectEngineering
dc.titleA Comparative Study on Power MOSFET Reliability and Failure Modes
dc.typeProceedings Paper
dspace.entity.typePublication
local.import.sourceWOS

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