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Material identification by surface reflection analysis in combination with bundle adjustment technique

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dc.contributor.authorOrun, AB
dc.contributor.authorAlkis, A
dc.date.accessioned2026-06-27T12:59:11Z
dc.date.issued2003
dc.description.abstractThis work aims to investigate a unified method for surface analysis and remote surface identification. The work includes two independent and simultaneously operating techniques which exploit both the local surface geometry (by bundle adjustment technique) and the microstructure of the material surface (whose image is generated by laser-surface interaction). The unification of these two techniques enables the unambiguous identification of surface type at any orientation. (C) 2002 Elsevier Science B.V. All rights reserved.en
dc.description.urihttps://doi.org/10.1016/s0167-8655(02)00398-7
dc.identifier.doi10.1016/s0167-8655(02)00398-7
dc.identifier.eissn1872-7344
dc.identifier.endpage1598
dc.identifier.issn0167-8655
dc.identifier.issue9-10
dc.identifier.startpage1589
dc.identifier.urihttps://hdl.handle.net/20.500.14981/48586
dc.identifier.volume24
dc.identifier.wos000181368900044
dc.language.isoeng
dc.publisherELSEVIER
dc.relation.ispartofPATTERN RECOGNITION LETTERS
dc.subjectphotogrammetry
dc.subjectCCD camera
dc.subjectsurface texture identification
dc.subjectactive vision
dc.subjectclassification
dc.subjectComputer Science
dc.titleMaterial identification by surface reflection analysis in combination with bundle adjustment technique
dc.typeArticle
dspace.entity.typePublication
local.import.sourceWOS

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