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Combined GANs and Classical Methods for Surface Defect Detection

dc.contributor.authorBayraktar, Ertugrul
dc.contributor.authorTosun, Beyza
dc.contributor.authorAltintas, Berke
dc.contributor.authorCelebi, Numan
dc.date.accessioned2026-06-27T14:59:49Z
dc.date.issued2022
dc.description.abstractObserving product quality is critical, cost-determining and time-consuming process for manufacturers. Product quality tests, on the other hand, are slow and inefficient. Human-based quality control is highly dependent on each individual controller, and traditional automated systems are both expensive and difficult to implement. With the hardware and software developments in computer vision, quality control has become fast, reliable, feasible and repeatable. In this study, we propose a deep artificial neural network-based algorithm, called DAfectNet, to detect defects on metal surfaces, uses visual data detection. During synthetic data generation, DAfectNet combines various conventional methods with a generative-adversarial network (GAN) and yields outputs that predict the class and location. While data generation with classical methods provided an improvement of 5.8% in performance as average precision, this value reached 74.95% with an increase of 8.45% using of GANs. We compared DAfectNet with the state-of-the-art methods in addition to analyzing the effects of transfer learning.en
dc.description.urihttps://doi.org/10.1109/siu55565.2022.9864705
dc.identifier.doi10.1109/siu55565.2022.9864705
dc.identifier.isbn978-1-6654-5092-8
dc.identifier.issn2165-0608
dc.identifier.urihttps://hdl.handle.net/20.500.14981/66924
dc.identifier.wos001307163400044
dc.language.isotur
dc.publisherIEEE
dc.relation.conference30th IEEE Signal Processing and Communications Applications Conference (SIU)
dc.relation.ispartof2022 30TH SIGNAL PROCESSING AND COMMUNICATIONS APPLICATIONS CONFERENCE, SIU
dc.subjectSurface defect detection
dc.subjectgenerative adversarial networks
dc.subjectfault detection
dc.subjectdata augmentation
dc.subjectVISION
dc.subjectComputer Science
dc.subjectEngineering
dc.subjectTelecommunications
dc.titleCombined GANs and Classical Methods for Surface Defect Detection
dc.typeProceedings Paper
dspace.entity.typePublication
local.import.sourceWOS

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