ZXCOM: a software for computation of radiation sensing attributes

Abstract

The main objective of this study is presentation of a new version of ZXCOM software that can calculate the effective atomic number (Z(eff)), the effective electron density (N-eff), and the elastic (Rayleigh) to inelastic (Compton) scattering ratio (R), for any element, compound, or mixture at energies from 1 keV to 100 GeV, over an interval of scattering angles extending from 0 degrees to 180 degrees. The ZXCOM runs under the MS Windows (R) operating system. It provides a useful interface that simplifies defining and redefining materials and experimental conditions. As an application of ZXCOM software, the Z(eff) and N-eff of some thick metal-oxide films, TMOFs (In2O3, WO3, Nb2O5, Cr2O3, SmCoO3, NiO, ZnO, Zn2SnO4, SnO2, CeO2, SmFeO3, TiO2, and LiCoO2), were calculated. The software created in this study can be used as a reliable and fast tool for the determination of the above parameters that are essential in a wide range of applications such as radiation shielding, radiotherapy, technology, etc.